Electron Microscopy
نویسندگان
چکیده
Electron microscopy uses high-energy elec tron beams to probe the structure and chem istry of both inorganic and biological materi als. The short wavelength (A) of electrons permits higher resolution images than light microscopes. This was a major motive in the early development of the transmission elec tron microscope (TEM) by Knoll and Ruska (1932) in Berlin, and atomic resolution is now routine. The TEM (Fig. 1) passes a parallel beam of electrons through a thin (i.e., * electron transparent) specimen creating highresolution images of the internal structure. In addition, A is such that electron diffraction patterns are formed from crystalline speci mens. The scanning electron microscope (SEM) shown in fig. 2 scans a fine convergent beam of electrons across the surface of a bulk specimen. It was first invented by von Ar denne (193$), but languished until the 1950s when Oatley’s group in Cambridge developed an instrument that became commercially avail able in the early 1960s (Oatley et al. 1965). SEM images of the specimen surface often
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